joint test action group การใช้

• The circuit board also had a Joint Test Action Group port for programming and radio control hardware.
• For this problem an industry group, the Joint Test Action Group ( JTAG ), developed a test technology called boundary scan.
• When the design is ready to be placed in a fabric, the developer simply generates an Joint Test Action Group ( JTAG ) cable.
• More recently the term also covers Joint Test Action Group ( JTAG ) based hardware debuggers which provide equivalent access using on-chip debugging hardware with standard production chips.
• The Joint Test Action Group ( JTAG ) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std . 1149.1-1990.
• Boundary scan testing requires that all the ICs to be tested use a standard test configuration procedure, the most common one being the Joint Test Action Group ( JTAG ) standard.
• In a board-test environment, serial to parallel testing has been formalized with a standard called " JTAG " ( named after the " Joint Test Action Group " that proposed it ).
• On-chip debugging, often loosely termed as " Joint Test Action Group " ( JTAG ), uses the provision of an additional debugging interface to the live hardware, in the production system.
• Although it was not referred to as an embedded instrument at the time of its development, the IEEE 1149.1 Boundary Scan Standard can be seen as the first enabling technology for embedded instrumentation . ( Boundary scan is also referred to as JTAG, after the Joint Test Action Group which initially undertook its development before it came under the aegis of a working group of the IEEE .  JTAG is often used to designate the access port on a chip which conforms to the boundary-scan standard . ) Some would consider the boundary-scan test process as a form of embedded instrumentation.